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Connectors for electronic equipment – Tests and measurements – Part 25-6: Test 25f: Eye pattern and jitter
standard by International Electrotechnical Commission, 05/26/2004

IEC 60512-25-6 Ed. 1.0 b:2004

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Describes methods for measuring an eye pattern response and jitter in the time domain.

Product Details

Edition:
1.0
Published:
05/26/2004
Number of Pages:
35
File Size:
1 file , 900 KB

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IEC 60512-25-6 Ed. 1.0 b:2004

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