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Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

Product Details

Edition:

1.0

Published:

11/07/2007

Number of Pages:

123

File Size:

1 file , 1.5 MB